TY  - GEN
TI  - Hierarchical Variability-Aware Compact Models of 20nm Bulk CMOS
SP  - 325
EP  - 328
A1  - Wang, X.
A1  - Reid, D.
A1  - Wang, L.
A1  - Burenkov, A.
A1  - Millar, C.
A1  - Lorenz, J.
A1  - Asenov, A.
ID  - enlighten110794
UR  - https://eprints.gla.ac.uk/110794/
N2  - No abstract available.
AV  - none
Y1  - 2015///
SN  - 9781467378598
ER  -