Category:Semiconductors
Bước tới điều hướng
Bước tới tìm kiếm
Deutsch: Halbleiter
· English: Semiconductor
· Français : Semi-conducteur
· Nederlands: Halfgeleider
· material that has electrical conductivity intermediate to that of a conductor and an insulator | |||||
Tải lên phương tiện | |||||
Là tập hợp con của | |||||
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Một phần của |
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Gồm có |
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English: Semiconductors are materials whose electronic properties can be controlled by adding small amounts of impurities to them.
Thể loại con
Thể loại này có 27 thể loại con sau, trên tổng số 27 thể loại con.
*
A
B
- Semiconductor business (10 F)
C
D
- Semiconductor layer diagrams (77 F)
G
H
- High density integration (7 F)
I
P
S
T
V
Tập tin trong thể loại “Semiconductors”
200 tập tin sau nằm trong thể loại này, trong tổng số 204 tập tin.
(Trang trước) (Trang sau)-
16321 RCA semiconductor.jpg 2.278×2.505; 513 kB
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16323 RCA semiconductor.jpg 2.515×2.089; 473 kB
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17413A RCA semiconductor.jpg 2.294×1.920; 398 kB
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18pml015 clock-chip-with-coffee-bean 2mb.jpg 1.481×1.204; 116 kB
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28 nm pitch aggressive multipatterning.png 869×552; 7 kB
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29йцуке.JPG 276×172; 4 kB
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2D device.PNG 936×609; 17 kB
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3D NAND minimum cost example.png 704×361; 10 kB
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3D NASA 1.jpg 526×403; 38 kB
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3D NASA 2.jpg 539×464; 43 kB
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3D NASA 3.jpg 525×411; 35 kB
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3DS die stacking concept model (DE).png 1.048×378; 27 kB
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3DS die stacking concept model.PNG 1.000×440; 65 kB
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56 nm hp polarized image.PNG 567×337; 13 kB
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Absorption Edge in Semiconductors.png 5.515×2.231; 379 kB
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Afmfig3.jpg 303×265; 22 kB
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Afmpiezofig1.jpg 353×380; 15 kB
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Afvlakcondensator.png 406×100; 508 byte
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Aldalox.jpg 1.346×1.045; 298 kB
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AM band NPN Audion.gif 284×232; 5 kB
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Analyse edx.svg 328×372; 17 kB
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ARTTS-Kamera.JPG 2.012×2.592; 981 kB
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Asdfffff gg.jpg 257×175; 18 kB
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Aufbau CMOS-Chip 2000er.svg 550×810; 84 kB
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B-ad-bcbprocessflow.png 635×850; 27 kB
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B-ad-crosssectionbcb.png 3.476×2.805; 1,45 MB
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B-ad-semphotoofsu8.png 2.546×1.995; 796 kB
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B-e-crosssectionsemofbondinginterface.png 1.694×1.153; 1,12 MB
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B-e-ultrasonicimage.png 227×230; 56 kB
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B-e-ultrasonicimageofblankeutecticwafer.png 373×379; 94 kB
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B-gf-crosssectionsembosch.png 1.511×1.182; 262 kB
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B-gf-crosssectionsemizm.png 1.501×1.164; 285 kB
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B-tc-tisibondinginterface.png 1.781×1.388; 250 kB
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Backring stress 01.JPG 313×409; 10 kB
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Beyond CMOS IRDS.jpg 405×248; 27 kB
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C-tlm fit.png 810×626; 37 kB
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Canti lever fig 01.JPG 475×413; 12 kB
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Canti lever type.jpg 396×219; 12 kB
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Caratteristica.diodo.ideale.png 438×200; 4 kB
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CdSeNanoplatelets.jpg 2.362×2.584; 679 kB
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ChipScaleClock2 HR.jpg 1.465×1.449; 1,29 MB
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Clapp Osz JFET Drain.gif 258×192; 4 kB
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Cmos-chip structure in 2000s (en).svg 550×810; 138 kB
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Cmut.jpg 1.231×297; 26 kB
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Comparacion tension.png 453×350; 33 kB
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Comparación de distintos semiconductores.png 347×285; 30 kB
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Contactvsnon.jpg 1.181×500; 147 kB
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Cross-section of MOSFET in IC.png 1.173×1.574; 258 kB
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Ctlm individiual measurements.png 385×327; 20 kB
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Cu vaheühendused ja madal-k dielektrik nende vahel.png 566×754; 381 kB
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Dc hoogfrequent.png 377×149; 908 byte
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Deep and Shallow SR profiles portrait.jpg 3.600×1.915; 240 kB
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Depletion-load NMOS logic (NOT).png 503×639; 13 kB
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Depletion-Region.png 396×201; 46 kB
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Diagram of a shockley diode.png 640×183; 14 kB
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Dimensioni minime Moore.jpg 380×289; 10 kB
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Diode-water-model.svg 594×399; 39 kB
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DUV vs EUV line edge variability.png 1.126×236; 55 kB
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Early LED Patents.png 1.742×625; 407 kB
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Electron Transport under Multiple Trapping and Release.png 3.997×2.294; 144 kB
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Electronic-collection hg.jpg 4.657×3.118; 3,02 MB
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Energy diagram of a LET.jpg 826×1.065; 137 kB
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Energy-level diagram in a molecular semiconductor.tif 801×970; 27 kB
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Enhancement-load NMOS logic (NOT).png 498×631; 13 kB
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Ersatzschema thyristortetrode.png 247×156; 1 kB
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ESS 2 B.jpg 601×441; 87 kB
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EUV 2D edge stochastic variability.png 564×274; 272 kB
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EUV contact-to-contact area variation.png 767×481; 49 kB
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EUV stochastic EPE.png 559×288; 17 kB
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Evolution of Photoconductance in TRMC Experiment.png 6.545×4.977; 560 kB
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Exotic semiconductors - Deutsches Museum - Munich.jpg 2.304×3.072; 3,82 MB
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FAMOS esq.png 1.007×767; 24 kB
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FET cross section.png 450×389; 12 kB
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Fig1a.b.c.jpg 592×192; 24 kB
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Fotodiode.png 1.085×908; 11 kB
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Four possible kinds of active electronic devices.tif 1.831×1.004; 450 kB
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FOWLP type.png 1.874×1.412; 181 kB
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Fram-ferroe-electric-capacitor.png 483×184; 23 kB
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FRAM-in-magnetic-field.png 695×553; 32 kB
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Gap silicio.jpg 812×250; 13 kB
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Grenzlastintegral.png 750×963; 237 kB
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Halbleitermaterialien aus DAHQ.svg 585×91; 50 kB
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Halbleiterspeicher-klassifizierung.svg 640×165; 76 kB
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High Bandwidth Memory schematic (zh-CN).svg 512×288; 29 kB
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High Bandwidth Memory schematic.svg 960×540; 47 kB
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Hiroshi Amano.jpg 1.024×683; 65 kB
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ILD(2).jpg 218×185; 29 kB
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INTERRUPTOR UNILATERAL DE SILICIO 3-3.jpg 1.816×676; 210 kB
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INTERRUPTOR UNILATERAL DE SILICIO 3-4.jpg 1.012×847; 107 kB
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InvenSense NasiriFabrication WithText.png 448×246; 58 kB
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Kishore.png 840×861; 310 kB
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Krysztalek 0211.jpg 718×1.311; 231 kB
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LED light emission cones from 2D plane emission zone.png 2.048×1.840; 1,2 MB
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Linear enhancement-load NMOS logic (NOT).png 527×653; 16 kB
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Mace mechanism.png 1.883×947; 118 kB
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Mace mechanism.svg 1.300×650; 11 kB
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Magnetic Semiconductor (5888009339).jpg 926×685; 415 kB
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MBshift for wiki.jpg 873×405; 39 kB
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Mediumwave FET Audion.gif 313×224; 6 kB
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Metal Oxide TFT Cross Section.png 1.440×1.020; 47 kB
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MIOS esq.png 1.007×767; 22 kB
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Miroirs de Bragg.jpg 551×425; 17 kB
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Mobility Edge.png 3.191×1.934; 107 kB
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Moores law (1970-2011).PNG 760×710; 99 kB
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MOSAID 1M DRAM report.jpg 1.458×734; 612 kB
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Mosfet iamion.GIF 318×355; 3 kB
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Mounted wafer.jpg 320×270; 42 kB
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Multi point 01.JPG 341×320; 12 kB
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NvSRAM-SONOS-technology.png 840×569; 78 kB
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OnSemi Micro8.wrl.stl 5.120×2.880; 69 kB
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OrcaSemi OS1000.webp 690×607; 40 kB
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P300J Wafer Probe Station.tif 3.264×2.448; 35,82 MB
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Pcafmassemb.jpg 255×270; 21 kB
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PCM-cell.jpg 794×441; 40 kB
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Peltz oscillator pnp.png 214×170; 3 kB
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Periodic table metalloids.jpg 4.500×1.396; 953 kB
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Pixel ginz pn II.jpg 572×310; 17 kB
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Pixel ginz pn.jpg 662×234; 18 kB
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Planaarne wikile.png 1.000×750; 26 kB
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Planaarne wikile1.png 1.000×750; 31 kB
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PMD Image GreyScale.jpg 337×264; 10 kB
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PMD Imager.jpg 1.582×1.040; 179 kB
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Pn Junction Diffusion and Drift-tr.svg 375×250; 19 kB
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Polythiophenes fluorescence NMR tube.jpg 640×480; 66 kB
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Predeposizione.jpg 589×250; 16 kB
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President Biden Joins the Virtual CEO Summit on Semiconductor and Supply Chain Resilience.webm 5 min 30 s, 1.920×1.080; 240,87 MB
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Principe FIB-en.svg 833×471; 4 kB
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Principe FIB-ru.svg 833×471; 4 kB
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Principe FIB.jpg 411×289; 18 kB
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Probecard 02.jpg 672×1.031; 101 kB
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Psychedelic Photovoltaic Cell.jpg 1.458×1.091; 309 kB
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Pulse-compression-NLTL-chip.jpg 600×470; 59 kB
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PXE1.jpg 2.749×3.024; 2,04 MB
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RadarGraphic.jpg 4.032×3.024; 327 kB
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Rochester Electronics Map.jpeg 5.334×3.501; 6,1 MB
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Room temperature electrical resistivity of various materials.jpg 1.280×595; 104 kB
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S-MOS Systems ASIC SLA6140.jpg 2.409×2.445; 7,17 MB
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SAMOS esq.png 1.007×767; 25 kB
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Saturated enhancement-load NMOS logic (NOT).png 498×631; 13 kB
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Seiler Osz npn Base.gif 238×227; 5 kB
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Semiconductor outlines.jpg 648×739; 201 kB
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Semiconductor shipment chart 1985-2007.PNG 1.370×450; 93 kB
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Semiconductor shipment chart 1985-2007.svg 880×300; 37 kB
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Semiconductor-1.jpg 400×236; 20 kB
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Semiconductor-conductivity.jpg 1.663×1.796; 426 kB
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SemiconductorRoadmap.PNG 1.150×787; 157 kB
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Semiconductors (way of working).jpg 720×840; 79 kB
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Semiconductors dspositives.png 590×212; 87 kB
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Semiconductors explanation.JPG 730×356; 61 kB
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Semiconductors Icon.svg 48×48; 16 kB
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SH323SC semiconductor.jpg 2.647×2.199; 507 kB
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ShockleyBldg (cropped).jpg 290×243; 56 kB
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ShockleyBldg.jpg 481×648; 103 kB
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ShockleyVacant.jpg 1.200×800; 280 kB
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Silicon die.jpg 2.304×1.728; 206 kB
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Silky semiconductor.jpg 1.388×1.040; 340 kB
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Silver Migration short 1.jpg 700×622; 47 kB
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Silver Migration short 2.jpg 527×482; 19 kB
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Simsni.gif 640×294; 3 kB
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SMD Tipos de Tamanos.jpg 680×426; 86 kB
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Soft lithography proc 1.jpg 570×331; 23 kB
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Soft lithography proc 2.jpg 575×323; 22 kB
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Soft lithography proc 3.jpg 600×600; 37 kB
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Soft lithography proc 3.svg 545×588; 8 kB
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Soft lithography proc1.svg 600×335; 3 kB
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Soft lithography proc2.svg 600×335; 4 kB
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Solargif1.gif 715×599; 77 kB
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Sonda scyntylacyjna.jpg 692×325; 22 kB
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Source-coupled oscillator.png 246×162; 4 kB
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SP1446 Motorola semiconductor.jpg 2.051×2.199; 422 kB
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ST3v3.2 bottom.jpg 3.504×2.336; 2,86 MB
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ST3v3.2 enclosure.jpg 2.574×2.336; 1,67 MB
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Stepper.gif 320×267; 77 kB
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Strati di nitruro ossido e silicio.jpg 530×266; 11 kB
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Structural periodicity of semiconductors.tif 2.546×717; 223 kB
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Structure of Sb2Se3.jpg 2.978×1.849; 587 kB
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Sus controlando SCR.jpg 1.576×888; 106 kB
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T484 semiconductor.jpg 2.663×1.909; 419 kB
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Test cell 01.JPG 1.058×488; 55 kB
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The structure of SBQWRTT.tif 1.877×2.191; 13 kB
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Time Resolved Microwave Conductivity System.png 2.234×1.513; 99 kB
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Transistor de aleación - Alloy pnp.png 1.007×767; 89 kB
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TrioScan1a.jpg 582×202; 24 kB
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TrioScan4a.jpg 615×290; 45 kB
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Tungsten carbide.jpg 1.200×500; 96 kB
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Vackar-oscillator.gif 304×143; 4 kB
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Vayyar.jpg 2.497×2.350; 651 kB
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Vertical type.jpg 432×203; 12 kB
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Vg vs. source-drain conductance.jpg 321×292; 9 kB
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Virata timeline.jpg 821×422; 44 kB
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Wafer prober.jpg 1.333×548; 59 kB
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Wafer300mm-LargeIC-testset.jpg 4.320×3.240; 3,38 MB
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Wien filter.jpg 300×302; 15 kB
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Wireless TSV (coils 1).PNG 400×760; 33 kB
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Wireless TSV (coils 2).PNG 500×650; 41 kB
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Wright.Etch.Fig2a.b.c.jpg 624×303; 31 kB
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Wright.Etch.Fig3a.b.c.jpg 627×246; 18 kB
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Wright.Etch.Fig4a.b.c.jpg 634×304; 46 kB
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Wytwarzanie elektretow.png 916×517; 29 kB
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XRL Currents.svg 655×665; 8 kB