Abstract

A method that uses the data of ray tracing for optical waveguide lens diagnostics is described. This method permits a direct reconstruction of the optical characteristics of a waveguide without the optical or the physical thickness being measured. Conditions are determined for the mathematical problem of diagnostics by ray tracing to have a unique solution, and a technique to obtain a numerical solution from noisy experimental data is described.

© 1994 Optical Society of America

Analysis of inhomogeneous optical systems by the use of ray tracing. I. Planar systems

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